Dependence of Four-Wave Mixing Line-Shape on Micrometric Atomic Vapor Thickness

Authors

  • Li Li Institute of Applied Physics and Computational Mathematics, Beijing, 100088, China
  • Yi-Xin Lu Institute of Optics & Electronics, Department of Physics and Optical-electronic Engineering, Xi’an University of Arts and Science, Xi’an 710065, China
  • Yuan-Yuan Li Institute of Optics & Electronics, Department of Physics and Optical-electronic Engineering, Xi’an University of Arts and Science, Xi’an 710065, China

DOI:

https://doi.org/10.4208/jams.060310.072010a

Keywords:

four-wave mixing, micrometric atomic vapor, Dicke-narrowing, polarization interference.

Abstract

We theoretically examine thickness and wavelength dependence line-shape of four-wave-mixing (FWM) spectroscopy in micrometric thin atomic vapors whose thickness $L$ is assumed to be 10,30,50,80 and 100 $\mu$m respectively. It is found that a narrow centre (Dicke-narrowing) persists for all cases, while wings are broadened as the thickness of the vapor increases or the pump wavelength decreases comparing to the probe wavelength. This type of spectrum is due to the modified velocity distribution and polarization interference from different ensemble of atoms in a confined situation.

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Published

2010-01-01

Issue

Vol. 1 No. 4 (2010)

Section

Articles